What do the gases silane and arsine look like and smell like? In
either case, you don't want to know.
Silane is pyrophoric, so the instant this ex-NASA
rocket-fuel accelerant gets out of the bottle and contacts air or any
other oxygenated compound, it spontaneously ignites or explodes. As for
arsine, OSHA has assigned it a PEL (Permissible Exposure Limit) of 0.05
ppm, which means that more than one part in 20 million can be toxic to
humans. Anyone catching a whiff of arsine, sufficient to detect its odor,
had better blurt out their findings fast because that person will shortly
be dead.
Silane and arsine, and their often equally nasty siblings,
comprise a family of specialty gases used extensively in the treatment of
semiconductor media during the integrated-circuit fabrication process.
Silicon wafer fabrication facilities, known as "fabs," apply these gases
to silicon wafers in arcane processes such as "etching," "doping," and
"deposition."
The control of process gases during wafer fabrication is
hypercritical for three reasons: 1) life safety; 2)material cost (the
hazardous nature and high purity requirements of these gases make them
expensive to produce); and 3) quality of the final semiconductor product
(contamination by only one errant molecule in a critical process gas can
defect a single chip; a batch-wide, gas-purity mishap can ruin a million
dollars worth of chips).
Air Liquide Electronics (ALE, Fremont, Calif.), supplies
specialty gas and gas distribution hardware to the electronics industry.
"Distribution hardware" refers to manifolding, valving, tubing, and
related controls that actually convey the gas to the fab processes.
The distribution system's primary purpose is
process-related because it supplies a continuous flow of expensive and
dangerous gas to process tools. Its secondary and substantially more
complicated task is batch related, and begins when gas flow is stopped for
empty cylinder replacement, system maintenance, or emergency shutdown.
It is then that safety and process-purity--less than one
ppb of contamination--issues require that molecular residue from the gases
be removed from the system. This clean-in-place (CIP) or "purging," is
done via precisely executed inertgas (usually nitrogen) pressurizations
and evacuations.
Mechanical overview
The standard mechanical system within a fab's process area consists of
a gas distribution module, which includes the "tool(s)," gas source, and
gas panel. The tool is any of the wafer fabrication machines that actually
apply the gas to the semiconductor media during various stages of the
fabrication. Actually, one tool might have as many as 15 separate gas
panels supplying it with different gases. Or, one gas panel might supply
as many as eight tools with a single gas.
The gas source is a standard 44-liter gas cylinder. It
supplies gas to the gas panel, which, in turn, conducts gas to wafer
processing tools. A second cylinder is used for back-up gas supply, thus
ensuring uninterrupted gas flow.
The gas panel, a matrix of stainless-steel tubing and
pneumatically actuated, normally closed diaphragm valves, is mounted above
the gas cylinders (see diagram). The valves are monitored and controlled
using a human-machine interface (HMI) and a programmable logic controller
(PLC). Control functions include switching the gas supply cylinder as
needed, providing locations for process and safety sensors and
implementing the "batch-like" CIP purges.
Because of variances in process requirements, many purge
routines are user-specific and must configured by the operator. Purge
requirements also vary widely with the type of gas used. High specific
gravity gases are kinetically sluggish and require longer purge times.
Other gases have tenacious residues. Process gases such as hydrogen
chloride are particularly "sticky," requiring longer purge times.
Maintaining higher gas purity also requires longer purges.
Cylinder changeouts are the most common reasons for purges.
They require the simplest sequences because only a short section of tubing
has to be purged before reintroduction of the process gas.
At the other extreme are system-wide purge routines. These
can have over 300 discrete, timed steps that include venturi-generated
evacuations, purge gas pressurizations, and sequenced valve actuations. A
menu of application-specific purge routines is needed--rather than having
"one big one do them all"--because some routines take hours to complete,
whereas others take minutes. Using the correct purge routine is necessary
because shutting down a fab's processes for longer than necessary is
expensive. Downtime costs can approach $100,000 per hour!
Redefining the process
In order to improve CIP efficiencies, ALE introduced its Reduced Purge
Volume (RPV) gas distribution hardware to decrease by half--both from time
taken and gases lost during a typical CIP purge. ALE chose a control
system from DST Controls Inc. (Benica, Ca.) to provide the flexibility
needed for the new "plumbing." DST's OEM control system was developed to
monitor and execute all of the complex purge--or gas batching--routines
that ALE's new hardware could now implement.
Additionally, wafer fabs also required that the gas
batching system meet some less precisely defined generic criteria. These
include flexibility, reliability, low cost, and fast-track development. A
premium was also placed on user-friendliness, aesthetic appearance, a
small hardware footprint, and on-time delivery.
The reasons for these requirements are due to constraints
and market pressures, unique to the semiconductor industry.
• Flexibility: Fabs are global, so a new controller had to
be easily configurable to accommodate a wide range of international
end-users' needs. Customer-specific "moving targets" included unique
computer/software systems and local area networks, requiring
bidirectional, plug-and-play communication. System security requirements
varied from complex multi-level password access, to key switches, to no
restrictions at all. Even the PLCs to be used were optional.
• Fast-track development: Because of the competitiveness in
the chip industry and the short commercial life of many semiconductor
products, new fabs typically must come on-line in a year or less. Vendor
equipment availability must keep pace with delivery requirements.
• Cost: OEM products aimed at fabs are subject to
competitive forces in a marketplace already flirting with overcapacity.
New equipment must be "strategically priced."
• Size: Cramped spaces typify fab environments, so the size
of all equipment matters.
• Reliability and user-friendliness: Fabs must deal with
dangerous gases (arsine, silane, etc.) and the high scrap costs of
products.
• Aesthetics: The customers fabs deal with are
sophisticated and high tech. All production equipment must meet these
criteria in both performance and appearance.
• On-time delivery: Because the fab industry is currently
the "mother-of-all-buyers' markets," with high financial and operating
safety risks, poor vendor performance is not tolerated. If there was a fab
bumper sticker, it would say "Break a promise, go away."
Purging, or clean-in-place, of gas panels is undeniably
characterized by batch process elements. In fact, it was only after ALE
and DST Controls viewed the system requirements from a "batch control"
perspective that the current solution could be developed. •
For more information, contact DST Controls: Tel:
707/745-5117; Fax: 707/745-8952; or Circle 227 on the Reader
Service Card.
The 'Batch' Solution
Treating the control design as a batch problem embedded in a
process environment was the approach used by DST Controls. DST viewed the
defining characteristic of "batch" as the ordered sequence of controlled
actions required to produce repeatable final products--in this case,
molecularly spotless gas vessels.
In fact, ALE's purging application had all three components
of a batch recipe: formula, procedure, and equipment. Although the same
generic purge routines would be used for normal cylinder changes and panel
maintenance, each would be implemented with a different formula,
configurable by the user for different gases in unique physical
installations.
Within these parameters, the controller would then
repeatedly execute its purge routines, often with over 300 precise steps.
The steps involved the actuation of multiple valves while monitoring
variable transducer values to confirm each step's completion. The control
system was to have the look and feel of a Pentium/Intellution batching
package--at a monochrome flat-panel price.
The controller's physical design took priority so that its
assembly could pace software development. Close attention to ergonomic
principles guided the design, especially for the service access doors and
panel openings. Electrical design required that all purge options be
supported with a minimum of I/O points and without module changes,
rewiring, or DIP-switch reselection.
Software development
For software development, ALE and DST reverse-engineered an existing
purge procedure, and recreated it as a 50-page flowchart. New software
developed from these flowcharts focus on guiding the operator through
abnormal purging situations by providing detailed on-screen text and
icons. Operators are alerted to problems that can be addressed and solved
during a long purge operation, avoiding possible restarting of the
sequence.
Purge sequencing contributed the most to program size and
complexity. Some purges required over 300 steps, no small task for the
unit's mid-range PLC. Because the required functions hogged PLC memory,
use of efficient coding was paramount; for example, resetting an index
value to zero saved two bytes by using a "block clear" instruction instead
of a 'move' instruction. The current program is one byte short of the 16K
limit for the selected CPU. Communication between the unit's touchscreen
and controller has also been optimized, allowing for greatly improved
screen update times.
Ease of use and system security also concerned the fab
operators. Although it has long been considered easiest to navigate these
options like climbing along the branches of a tree, changes in PC-based
operating systems now allow operators to "jump sideways to an adjacent
branch," when necessary. Layout and hierarchy of screens were redesigned,
allowing quicker, more intuitive navigation and reducing operator training
time. Since no two customers had the same interpretation of which
functions should be secured or how, the batch application's recipe was
extended one further step, implementing a fully customizable security
system.
Manual mode is typically the most secure function in any
customer's eyes. It is assumed that if operators have satisfied all the
requirements to access manual mode, then they can take responsibility for
operating the controller safely. However, in order to (continued on p. xx)
(continued from p. xx)
assure absolute system safety, a set of manual interlocks, which step
an operator through especially hazardous valve sequences, was implemented.
A look at the controller
The controller cabinet is rated NEMA 4. It features a 10-in.
touchscreen display, alarm horn, LED indicators, key-switch, and an
emergency-stop button-- mounted in the hinged front cover. The default PLC
is a GE Fanuc Series 90-30 PLC. It is mounted on a pull-out tray behind
the shock-mounted cover. Cost, size, memory capacity, expanded
communication protocol capability, availability of worldwide service, and
acceptance by the semiconductor industry all played a part in GE Fanuc's
selection.
Because the controller must operate in a Class I, Div. 2
environment, a 16-station, electropneumatic interface card transforms the
PLCs 24 V dc output signals into nitrogen gas pulses. These pulses then
actuate the intrinsically safe gas panel valves. The panel's
sensor/transducers are 4-20 mA or 1-5 V dc, and input directly to the PLC.
They monitor pressure, flow, and gas cylinder weights, detecting remaining
gas quantities.
Other controller features include:
• Operator configuration and execution of default and custom purge
routines.
• Fail-safe and interlock gas panel valving, to ensure safe states
during operator-executed cylinder changes, manual purges, and maintenance.
• Capability of monitoring low-pressure (empty cylinder) alarms or
other out-of-spec conditions.
• Capability of monitoring, alarming, and initiating automatic
shutdowns for fire, seismic events, gas and fluid leaks, E-stops, and
panel malfunctions.
• Communication of system conditions to end-user's fab-wide,
life-safety LANs.
• Access to 50 interactive screens for real-time system status
indications and operator control.
• Reconfigurability of all purge and monitoring
functions.